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Capec-438 Detail

Modification During Manufacture

Meta Supply Chain Software Hardware

Children: 444 447

Threats: T62 T68 T274 T393

Description

An attacker modifies a technology, product, or component during a stage in its manufacture for the purpose of carrying out an attack against some entity involved in the supply chain lifecycle. There are an almost limitless number of ways an attacker can modify a technology when they are involved in its manufacture, as the attacker has potential inroads to the software composition, hardware design and assembly, firmware, or basic design mechanics. Additionally, manufacturing of key components is often outsourced with the final product assembled by the primary manufacturer. The greatest risk, however, is deliberate manipulation of design specifications to produce malicious hardware or devices. There are billions of transistors in a single integrated circuit and studies have shown that fewer than 10 transistors are required to create malicious functionality.

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External ID Source Link Description
CAPEC-438 capec https://capec.mitre.org/data/definitions/438.html
T1195 ATTACK https://attack.mitre.org/wiki/Technique/T1195 Supply Chain Compromise
REF-379 reference_from_CAPEC https://nvlpubs.nist.gov/nistpubs/SpecialPublications/NIST.SP.800-161r1-draft2.pdf Jon Boyens, Angela Smith, Nadya Bartol, Kris Winkler, Alex Holbrook, Matthew Fallon, Cybersecurity Supply Chain Risk Management Practices for Systems and Organizations (2nd Draft), 2021--10---28, National Institute of Standards and Technology (NIST)
REF-380 reference_from_CAPEC Marcus Sachs, Supply Chain Attacks: Can We Secure Information Technology Supply Chain in the Age of Globalization, Verizon, Inc.
REF-381 reference_from_CAPEC Thea Reilkoff, Hardware Trojans: A Novel Attack Meets a New Defense, 2010, Yale School of Engineering and Applied Science
REF-382 reference_from_CAPEC Marianne Swanson, Nadya Bartol, Rama Moorthy, Piloting Supply Chain Risk Management Practices for Federal Information Systems (Draft NISTIR 7622), 2010, National Institute of Standards and Technology

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